Abberior Instruments GmbH
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Nov 2035
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Feb 20, 2027The maintenance fee for Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope (US 10,386,621) comes due Feb 20, 2027. Unpaid by Aug 20, 2027, it lapses early.
- 2 fees due Apr 1 to 3, 2027 · next Apr 1
- 1 fee due May 26, 2027The maintenance fee for Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers (US 10,488,342) comes due May 26, 2027. Unpaid by Nov 26, 2027, it lapses early.
- 1 fee due Sep 19, 2027The maintenance fee for Method, Computer Program, and Apparatus for Adapting an Estimator for Use in a Microscope (US 11,933,729) comes due Sep 19, 2027. Unpaid by Mar 20, 2028, it lapses early.
- 2 fees due Oct 2 to 23, 2027 · next Oct 2
Recent changes
- 6 of the patents on this record were granted since Aug 17, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 9,632,297 | Device for separately modulating the wave fronts of two components of a light beam and microscope comprising the device In force · From the USPTO record | In force | From the USPTO record | |
| US 9,645,376 | Scanner head and device with scanner head In force · From the USPTO record | In force | From the USPTO record | |
| US 10,429,305 | Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers In force · From the USPTO record | In force | From the USPTO record | |
| US 10,488,342 | Methods of high-resolution imaging a structure of a sample, the structure being marked with fluorescence markers In force · From the USPTO record | In force | From the USPTO record | |
| US 10,386,621 | Method of using a high resolution laser scanning microscope and high resolution laser scanning microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 11,131,630 | Method of aligning a laser-scanning fluorescence microscope and laser-scanning fluorescence microscope having an automatic aligning system In force · From the USPTO record | In force | From the USPTO record | |
| US 10,795,140 | Method, device and laser scanning microscope for generating rasterized images In force · From the USPTO record | In force | From the USPTO record | |
| US 11,460,618 | Apparatus for selectively shaping phase fronts of a light beam, and use thereof In force · From the USPTO record | In force | From the USPTO record | |
| US 11,493,744 | Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly In force · From the USPTO record | In force | From the USPTO record | |
| US 11,947,097 | Bandpass filter for light having variable lower and upper cut-off wavelengths In force · From the USPTO record | In force | From the USPTO record |
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
7 pending · 1 abandoned · 11 no status recorded