Active Impulse Systems, Inc.
Records under this name other than patents Active Impulse Systems, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
Back to Active Impulse Systems, Inc.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 6,256,100 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure Formerly held Lapsed on the fee record Ended Jul 3, 2013 · From the USPTO record | Lapsed on the fee record | Ended Jul 3, 2013 | From the USPTO record |
| US 6,175,421 | Method and apparatus for measuring material properties using transient-grating spectroscopy Lapsed on the fee record Ended Jan 16, 2013 · From the USPTO record | Lapsed on the fee record | Ended Jan 16, 2013 | From the USPTO record |
| US 6,795,198 | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry Formerly held Lapsed on the fee record Ended Sep 21, 2012 · From the USPTO record | Lapsed on the fee record | Ended Sep 21, 2012 | From the USPTO record |
| US 6,118,533 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials Formerly held Lapsed on the fee record Ended Sep 12, 2012 · From the USPTO record | Lapsed on the fee record | Ended Sep 12, 2012 | From the USPTO record |
| US 6,081,330 | Method and device for measuring the thickness of opaque and transparent films Lapsed on the fee record Ended Jun 27, 2012 · From the USPTO record | Lapsed on the fee record | Ended Jun 27, 2012 | From the USPTO record |
| US 6,075,602 | Method and apparatus for measuring material properties using transient-grating spectroscopy Lapsed on the fee record Ended Jun 13, 2012 · From the USPTO record | Lapsed on the fee record | Ended Jun 13, 2012 | From the USPTO record |
| US 6,069,703 | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure Formerly held Lapsed on the fee record Ended May 30, 2012 · From the USPTO record | Lapsed on the fee record | Ended May 30, 2012 | From the USPTO record |
| US 6,734,982 | Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure Lapsed on the fee record Ended May 11, 2012 · From the USPTO record | Lapsed on the fee record | Ended May 11, 2012 | From the USPTO record |
| US 6,052,185 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials Formerly held Lapsed on the fee record Ended Apr 18, 2012 · From the USPTO record | Lapsed on the fee record | Ended Apr 18, 2012 | From the USPTO record |
| US 6,348,967 | Method and device for measuring the thickness of opaque and transparent films Term ended Term ended Feb 2, 2012 · From the USPTO record | Term ended | Term ended Feb 2, 2012 | From the USPTO record |