Aehr Test Systems
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 6 name spellings.
27
Ending by 2030
Dec 2027
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Jan 21, 2027The maintenance fee for Adhesively Attached Stand-Offs On A Portable Pack For An Electronics Tester (US 9,086,449) comes due Jan 21, 2027. Unpaid by Jul 21, 2027, it lapses early.
- 1 fee due Mar 3, 2027The maintenance fee for Limiting Translation for Consistent Substrate-To-Substrate Contact (US 10,401,385) comes due Mar 3, 2027. Unpaid by Sep 3, 2027, it lapses early.
- 3 fees due May 5 to 26, 2027 · next May 5
- 1 fee due Jun 5, 2027The maintenance fee for Electronics Tester (US 11,835,575) comes due Jun 5, 2027. Unpaid by Dec 6, 2027, it lapses early.
- 1 fee due Aug 2, 2027The maintenance fee for System for Testing an Integrated Circuit of a Device and Its Method of Use (US 9,250,291) comes due Aug 2, 2027. Unpaid by Feb 2, 2028, it lapses early.
- 1 fee due Sep 22, 2027The maintenance fee for Electronics Tester with a Valve Integrally Formed in a Component of a Portable Pack (US 9,291,668) comes due Sep 22, 2027. Unpaid by Mar 22, 2028, it lapses early.
- 2 fees due Nov 7 to 12, 2027 · next Nov 7
Recent changes
- 3 of the patents on this record were granted since Aug 16, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,228,085 | System for Testing an Integrated Circuit of a Device and Its Method of Use In force · High confidence | In force | High confidence | |
| US 7,902,846 | Electronics Tester with a Signal Distribution Board and a Wafer Chuck Having Different Coefficients of Thermal Expansion In force · High confidence | In force | High confidence | |
| US 8,198,909 | Electronics Tester with a Signal Distribution Board and a Wafer Chuck Having Different Coefficients of Thermal Expansion In force · High confidence | In force | High confidence | |
| US 9,291,668 | Electronics Tester with a Valve Integrally Formed in a Component of a Portable Pack In force · High confidence | In force | High confidence | |
| US 9,500,702 | Electronics Tester with Hot Fluid Thermal Control In force · High confidence | In force | High confidence | |
| US 9,857,418 | Electronics Tester with Group and Individual Current Configurations In force · High confidence | In force | High confidence | |
| US 10,151,793 | Electronics Tester with Double-Spiral Thermal Control Passage in a Thermal Chuck In force · High confidence | In force | High confidence | |
| US 10,718,808 | Electronics Tester with Current Amplification In force · High confidence | In force | High confidence | |
| US 10,976,362 | Electronics Tester with Power Saving State In force · High confidence | In force | High confidence | |
| US 11,448,695 | System for Testing an Integrated Circuit of a Device and Its Method of Use In force · High confidence | In force | High confidence |
Also on record, not counted in the 50: 44 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
11 pending