Alphane Labs, LLC
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Jul 2034
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Feb 1, 2027The maintenance fee for Self-calibrating analyte sensor (US 11,714,066) comes due Feb 1, 2027. Unpaid by Aug 2, 2027, it lapses early.
- 1 fee due Apr 8, 2027The maintenance fee for Gas sensor with humidity correction (US 10,436,737) comes due Apr 8, 2027. Unpaid by Oct 8, 2027, it lapses early.
- 1 fee due Sep 30, 2027The maintenance fee for Gas sensor incorporating a temperature-controlled sensing material (US 10,605,778) comes due Sep 30, 2027. Unpaid by Mar 31, 2028, it lapses early.
- 1 fee due Oct 2, 2027The maintenance fee for Method for producing a crystalline film on a substrate surface (US 11,946,160) comes due Oct 2, 2027. Unpaid by Apr 3, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
Showing 1 to 8 of 8
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 9,366,651 | Array of sensors with surface modifications In force · From the USPTO record | In force | From the USPTO record | |
| US 9,857,243 | Self-correcting chemical sensor In force · From the USPTO record | In force | From the USPTO record | |
| US 10,436,737 | Gas sensor with humidity correction In force · From the USPTO record | In force | From the USPTO record | |
| US 10,605,778 | Gas sensor incorporating a temperature-controlled sensing material In force · From the USPTO record | In force | From the USPTO record | |
| US 11,946,160 | Method for producing a crystalline film on a substrate surface In force · From the USPTO record | In force | From the USPTO record | |
| US 11,643,751 | Apparatus and Method For Producing a Crystalline Film on a Substrate Surface In force · High confidence | In force | High confidence | |
| US 11,714,066 | Self-calibrating analyte sensor In force · From the USPTO record | In force | From the USPTO record | |
| US 12,059,703 | Method For Producing a Crystalline Film In force · High confidence | In force | High confidence |
Also on record, not counted in the 8: 3 lapsed for an unpaid fee. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.