The Patent Finder

Auros Technology, Inc.

31 patents currently held · Updated Nov 15, 2026
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
May 2040
Next term end

When these terms end

Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045

Fee deadlines

Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
  • 1 fee due Apr 10, 2027
    The maintenance fee for Overlay measuring device and method for controlling focus and program therefor (US 11,781,996) comes due Apr 10, 2027. Unpaid by Oct 12, 2027, it lapses early.
  • 3 fees due Jun 5 to 19, 2027 · next Jun 5
  • 1 fee due Jul 16, 2027
    The maintenance fee for Apparatus for transferring optical instrument (US 11,874,104) comes due Jul 16, 2027. Unpaid by Jan 18, 2028, it lapses early.
  • 2 fees due Oct 16 to 30, 2027 · next Oct 16

Which patents, and when each one lapses · Pro

Recent changes

  • 3 of the patents on this record were granted since Aug 17, 2026

Patents held now

Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
PatentTitleStatus Expires Confidence
US 12,001,146Overlay Measurment Device
In force
 · High confidence
In forceHigh confidence
US 12,085,383Overlay Measurment Device
In force
 · Medium confidence
In forceMedium confidence
US 11,604,421Overlay mark, overlay measurement method and semiconductor device manufacturing method using the overlay mark
In force
 · From the USPTO record
In forceFrom the USPTO record
US 12,066,331Polarization analysis apparatus and method for adjusting angle of incidence or numerical aperture using aperture
In force
 · From the USPTO record
In forceFrom the USPTO record
US 11,835,447Method for measuring characteristic of thin film
In force
 · From the USPTO record
In forceFrom the USPTO record
US 11,874,104Apparatus for transferring optical instrument
In force
 · From the USPTO record
In forceFrom the USPTO record
US 11,835,865Overlay measurement apparatus
In force
 · From the USPTO record
In forceFrom the USPTO record
US 12,021,040Overlay Mark Forming Moire Pattern, Overlay Measurement Method Using Same, and Manufacturing Method of Semiconductor Device Using Same
In force
 · High confidence
In forceHigh confidence
US 11,971,248Wavelength-Tunable Fiber Optic Light Source and Overlay Measurement Device with Same
In force
 · High confidence
In forceHigh confidence
US 11,781,996Overlay measuring device and method for controlling focus and program therefor
In force
 · From the USPTO record
In forceFrom the USPTO record
10 of 31 patents shown.
Pro members see all 31.
Pro members: see all 31 patents

Sources and methods

Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand. How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.

Published applications

US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.

6 pending · 2 no status recorded

List them

The Patent Finder CompaniesExpirationsCalculatorWatchlistPricing MethodologyCorrectionsLegalPrivacysupport@thepatentfinder.com Updated Nov 15, 2026 · includes USPTO assignment & status data published Nov 15, 2026 and grant & fee data published Nov 10, 2026 (weekly) Part of 137 Finder · © 2026 137 Finder LLC · Sources cited