Auros Technology, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
May 2040
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Apr 10, 2027The maintenance fee for Overlay measuring device and method for controlling focus and program therefor (US 11,781,996) comes due Apr 10, 2027. Unpaid by Oct 12, 2027, it lapses early.
- 3 fees due Jun 5 to 19, 2027 · next Jun 5
- 1 fee due Jul 16, 2027The maintenance fee for Apparatus for transferring optical instrument (US 11,874,104) comes due Jul 16, 2027. Unpaid by Jan 18, 2028, it lapses early.
- 2 fees due Oct 16 to 30, 2027 · next Oct 16
Recent changes
- 3 of the patents on this record were granted since Aug 17, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 12,001,146 | Overlay Measurment Device In force · High confidence | In force | High confidence | |
| US 12,085,383 | Overlay Measurment Device In force · Medium confidence | In force | Medium confidence | |
| US 11,604,421 | Overlay mark, overlay measurement method and semiconductor device manufacturing method using the overlay mark In force · From the USPTO record | In force | From the USPTO record | |
| US 12,066,331 | Polarization analysis apparatus and method for adjusting angle of incidence or numerical aperture using aperture In force · From the USPTO record | In force | From the USPTO record | |
| US 11,835,447 | Method for measuring characteristic of thin film In force · From the USPTO record | In force | From the USPTO record | |
| US 11,874,104 | Apparatus for transferring optical instrument In force · From the USPTO record | In force | From the USPTO record | |
| US 11,835,865 | Overlay measurement apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 12,021,040 | Overlay Mark Forming Moire Pattern, Overlay Measurement Method Using Same, and Manufacturing Method of Semiconductor Device Using Same In force · High confidence | In force | High confidence | |
| US 11,971,248 | Wavelength-Tunable Fiber Optic Light Source and Overlay Measurement Device with Same In force · High confidence | In force | High confidence | |
| US 11,781,996 | Overlay measuring device and method for controlling focus and program therefor In force · From the USPTO record | In force | From the USPTO record |
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
6 pending · 2 no status recorded