The Patent Finder

BT Imaging Pty Ltd

11 patents currently held · Updated Nov 15, 2026
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.

Recorded under 2 name spellings.

7
Ending by 2030
Mar 2027
Next term end

When these terms end

Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045

Fee deadlines

Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
  • 1 fee due Nov 19, 2026
    The maintenance fee for In-line photoluminescence imaging of semiconductor devices (US 9,035,267) comes due Nov 19, 2026. Unpaid by May 19, 2027, it lapses early.
  • 1 fee due Apr 13, 2027
    The maintenance fee for Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials (US 9,157,863) comes due Apr 13, 2027. Unpaid by Oct 13, 2027, it lapses early.
  • 1 fee due Jun 10, 2027
    The maintenance fee for Methods for inspecting semiconductor wafers (US 10,502,687) comes due Jun 10, 2027. Unpaid by Dec 10, 2027, it lapses early.

Which patents, and when each one lapses · Pro

Recent changes

  • 1 term has ended since Aug 17, 2026

Patents held now

Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
PatentTitleStatus Expires Confidence
US 9,909,991Method and system for inspecting indirect bandgap semiconductor structure
In force
 · From the USPTO record
In forceFrom the USPTO record
US 9,912,291Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
In force
 · From the USPTO record
In forceFrom the USPTO record
US 9,482,625Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
In force
 · From the USPTO record
In forceFrom the USPTO record
US 9,546,955Wafer Imaging and Processing Method and Apparatus
In force
 · High confidence
In forceHigh confidence
US 8,710,860Method and System for Testing Indirect Bandgap Semiconductor Devices Using Luminescence Imaging
In force
 · High confidence
In forceHigh confidence
US 8,483,476Photovoltaic Cell Manufacturing
In force
 · High confidence
In forceHigh confidence
US 9,157,863Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
In force
 · From the USPTO record
In forceFrom the USPTO record
US 9,035,267In-line photoluminescence imaging of semiconductor devices
In force
 · From the USPTO record
In forceFrom the USPTO record
US 10,241,051Methods for Inspecting Semiconductor Wafers
In force
 · Low confidence
In forceLow confidence
US 10,502,687Methods for inspecting semiconductor wafers
In force
 · From the USPTO record
In forceFrom the USPTO record
10 of 11 patents shown.
Pro members see all 11.
Pro members: see all 11 patents
Also on record, not counted in the 11: 7 lapsed for an unpaid fee. List them

Sources and methods

Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand. How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.

Published applications

US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.

1 abandoned · 9 no status recorded

List them

The Patent Finder CompaniesExpirationsCalculatorWatchlistPricing MethodologyCorrectionsLegalPrivacysupport@thepatentfinder.com Updated Nov 15, 2026 · includes USPTO assignment & status data published Nov 15, 2026 and grant & fee data published Nov 10, 2026 (weekly) Part of 137 Finder · © 2026 137 Finder LLC · Sources cited