BT Imaging Pty Ltd
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 2 name spellings.
7
Ending by 2030
Mar 2027
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Nov 19, 2026The maintenance fee for In-line photoluminescence imaging of semiconductor devices (US 9,035,267) comes due Nov 19, 2026. Unpaid by May 19, 2027, it lapses early.
- 1 fee due Apr 13, 2027The maintenance fee for Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials (US 9,157,863) comes due Apr 13, 2027. Unpaid by Oct 13, 2027, it lapses early.
- 1 fee due Jun 10, 2027The maintenance fee for Methods for inspecting semiconductor wafers (US 10,502,687) comes due Jun 10, 2027. Unpaid by Dec 10, 2027, it lapses early.
Recent changes
- 1 term has ended since Aug 17, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 9,909,991 | Method and system for inspecting indirect bandgap semiconductor structure In force · From the USPTO record | In force | From the USPTO record | |
| US 9,912,291 | Method and system for testing indirect bandgap semiconductor devices using luminescence imaging In force · From the USPTO record | In force | From the USPTO record | |
| US 9,482,625 | Method and system for testing indirect bandgap semiconductor devices using luminescence imaging In force · From the USPTO record | In force | From the USPTO record | |
| US 9,546,955 | Wafer Imaging and Processing Method and Apparatus In force · High confidence | In force | High confidence | |
| US 8,710,860 | Method and System for Testing Indirect Bandgap Semiconductor Devices Using Luminescence Imaging In force · High confidence | In force | High confidence | |
| US 8,483,476 | Photovoltaic Cell Manufacturing In force · High confidence | In force | High confidence | |
| US 9,157,863 | Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials In force · From the USPTO record | In force | From the USPTO record | |
| US 9,035,267 | In-line photoluminescence imaging of semiconductor devices In force · From the USPTO record | In force | From the USPTO record | |
| US 10,241,051 | Methods for Inspecting Semiconductor Wafers In force · Low confidence | In force | Low confidence | |
| US 10,502,687 | Methods for inspecting semiconductor wafers In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 11: 7 lapsed for an unpaid fee. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 abandoned · 9 no status recorded