Celadon Systems, Inc.
1 more in force is now held by another company
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 2 name spellings.
4
Ending by 2030
May 2028
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Nov 21, 2026The maintenance fee for Probe card with stress relieving feature (US 10,295,565) comes due Nov 21, 2026. Unpaid by May 21, 2027, it lapses early.
- 1 fee due Sep 19, 2027The maintenance fee for Portable Probe Card Assembly (US 11,933,816) comes due Sep 19, 2027. Unpaid by Mar 20, 2028, it lapses early.
- 1 fee due Oct 14, 2027The maintenance fee for Modular rail systems, rail systems, mechanisms, and equipment for devices under test (US 10,620,262) comes due Oct 14, 2027. Unpaid by Apr 14, 2028, it lapses early.
Recent changes
- 1 of the patents on this record was granted since Aug 16, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,999,564 | Replaceable probe apparatus for probing semiconductor wafer In force · From the USPTO record | In force | From the USPTO record | |
| US 7,728,609 | Replaceable probe apparatus for probing semiconductor wafer In force · From the USPTO record | In force | From the USPTO record | |
| US D713,363 | Support for a probe test core In force · From the USPTO record | In force | From the USPTO record | |
| US D722,031 | Top contact layout board in an electrical system In force · From the USPTO record | In force | From the USPTO record | |
| US 9,678,149 | Test apparatus having a probe core with a twist lock mechanism In force · From the USPTO record | In force | From the USPTO record | |
| US 8,698,515 | Probe test equipment for testing a semiconductor device In force · From the USPTO record | In force | From the USPTO record | |
| US 8,674,715 | Test apparatus having a probe core with a twist lock mechanism In force · From the USPTO record | In force | From the USPTO record | |
| US 8,994,390 | Test Systems with a Probe Apparatus and Index Mechanism In force · High confidence | In force | High confidence | |
| US 9,018,966 | Test Apparatus Having a Probe Card and Connector Mechanism In force · High confidence | In force | High confidence | |
| US 10,145,863 | Test systems with a probe apparatus and index mechanism In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 20: 1 patent in force now held by others · 1 lapsed for an unpaid fee · 24 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
3 no status recorded