Chapman Instruments, Inc.
Records under this name other than patents Chapman Instruments, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
Showing 1 to 6 of 6 · Back to Chapman Instruments, Inc.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,283,256 | Method and apparatus for measuring wafer thickness Term ended Term ended Sep 21, 2024 · From the USPTO record | Term ended | Term ended Sep 21, 2024 | From the USPTO record |
| US 7,280,232 | Method and apparatus for measuring wafer thickness Lapsed on the fee record Ended Oct 9, 2019 · From the USPTO record | Lapsed on the fee record | Ended Oct 9, 2019 | From the USPTO record |
| US 6,157,450 | Automated optical surface profile measurement system Lapsed on the fee record Ended Dec 5, 2012 · From the USPTO record | Lapsed on the fee record | Ended Dec 5, 2012 | From the USPTO record |
| US 6,342,705 | System for locating and measuring an index mark on an edge of a wafer Lapsed on the fee record Ended Jan 29, 2010 · From the USPTO record | Lapsed on the fee record | Ended Jan 29, 2010 | From the USPTO record |
| US 5,017,012 | Viewing system for surface profiler Term ended Term ended no later than May 21, 2011 · Low confidence | Term ended | Term ended no later than May 21, 2011 | Low confidence |
| US 5,986,753 | Wafer holding and orienting fixture for optical profilometry Term ended Term ended no later than Nov 16, 2019 · Low confidence | Term ended | Term ended no later than Nov 16, 2019 | Low confidence |