Dpix, LLC
1 more in force is now held by another company
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
1
Ending by 2030
Nov 2028
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Apr 30, 2027The maintenance fee for Manufacturing quality improvement through statistical root cause analysis using convolution neural networks (US 11,803,953) comes due Apr 30, 2027. Unpaid by Nov 1, 2027, it lapses early.
- 1 fee due Aug 23, 2027The maintenance fee for Flat panel image sensor and method of manufacturing thereof (US 9,269,737) comes due Aug 23, 2027. Unpaid by Feb 23, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,902,004 | ESD induced artifact reduction design for a thin film transistor image sensor array In force · From the USPTO record | In force | From the USPTO record | |
| US 9,269,737 | Flat panel image sensor and method of manufacturing thereof In force · From the USPTO record | In force | From the USPTO record | |
| US 10,114,379 | Point to point material transport vehicle improvements for glass substrate In force · From the USPTO record | In force | From the USPTO record | |
| US 9,786,856 | Method of manufacturing an image sensor device In force · From the USPTO record | In force | From the USPTO record | |
| US 9,853,084 | Method of manufacturing a semiconductor device In force · From the USPTO record | In force | From the USPTO record | |
| US 9,773,836 | Method and functional architecture for inline repair of defective lithographically masked layers In force · From the USPTO record | In force | From the USPTO record | |
| US 10,147,765 | Test structures for manufacturing process of organic photo diode imaging array In force · From the USPTO record | In force | From the USPTO record | |
| US 10,026,863 | Method of manufacturing a sensor array In force · From the USPTO record | In force | From the USPTO record | |
| US 9,929,215 | Method of optimizing an interface for processing of an organic semiconductor In force · From the USPTO record | In force | From the USPTO record | |
| US 10,295,566 | Method of Providing a High Density Test Contact Solution In force · High confidence | In force | High confidence |
Also on record, not counted in the 16: 1 patent in force now held by others · 2 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 pending · 6 no status recorded