Elite Semiconductor Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
1
Ending by 2030
Mar 2030
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Dec 4, 2026The maintenance fee for Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium (US 10,312,164) comes due Dec 4, 2026. Unpaid by Jun 4, 2027, it lapses early.
- 3 fees due Feb 8, 2027
- 3 fees due Mar 8 to 19, 2027 · next Mar 8
- 2 fees due Apr 3, 2027
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,095,895 | Method for defect diagnosis and management In force · From the USPTO record | In force | From the USPTO record | |
| US 8,312,401 | Method for Smart Defect Screen and Sample In force · High confidence | In force | High confidence | |
| US 8,473,223 | Method for utilizing fabrication defect of an article In force (reinstated) · From the USPTO record | In force (reinstated) | From the USPTO record | |
| US 9,129,237 | Integrated interfacing system and method for intelligent defect yield solutions In force · From the USPTO record | In force | From the USPTO record | |
| US 10,312,164 | Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium In force · From the USPTO record | In force | From the USPTO record | |
| US 10,228,421 | Method and System for Intelligent Defect Classification and Sampling, and Non-Transitory Computer-Readable Storage Device In force · High confidence | In force | High confidence | |
| US 10,409,924 | Intelligent CAA failure pre-diagnosis method and system for design layout In force · From the USPTO record | In force | From the USPTO record | |
| US 11,719,648 | Method for smart conversion and calibration of coordinate In force · From the USPTO record | In force | From the USPTO record | |
| US 11,719,649 | Method for smart conversion and calibration of coordinate In force · From the USPTO record | In force | From the USPTO record | |
| US 11,719,650 | Method for performing smart semiconductor wafer defect calibration In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 15: 3 lapsed for an unpaid fee · 1 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
Every application published under this name has become a patent.