Epir, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Nov 2039
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Dec 6, 2026The maintenance fee for Modified direct bond interconnect for FPAs (US 11,670,616) comes due Dec 6, 2026. Unpaid by Jun 7, 2027, it lapses early.
- 1 fee due Feb 15, 2027The maintenance fee for In-situ laser annealing of Te growth defects in CdZnTe (ilast-czt) (US 11,725,300) comes due Feb 15, 2027. Unpaid by Aug 16, 2027, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
Showing 1 to 7 of 7
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 11,506,598 | Compact apparatus for high-speed chemical spectral signature measurement and method of using same In force · From the USPTO record | In force | From the USPTO record | |
| US 12,007,323 | Compact apparatus for high-speed chemical spectral signature measurement and method of using same In force · From the USPTO record | In force | From the USPTO record | |
| US 11,670,616 | Modified direct bond interconnect for FPAs In force · From the USPTO record | In force | From the USPTO record | |
| US 11,725,300 | In-situ laser annealing of Te growth defects in CdZnTe (ilast-czt) In force · From the USPTO record | In force | From the USPTO record | |
| US 12,075,701 | HgCdTe metasurface-based terahertz source and detector In force · From the USPTO record | In force | From the USPTO record | |
| US 12,317,633 | Radiation hardened infrared focal plane array In force · From the USPTO record | In force | From the USPTO record | |
| US 12,540,905 | System and method for optical mapping of semiconductor wafers at cryogenic temperatures under transmission geometry In force · High confidence | In force | High confidence |
Also on record, not counted in the 7: 1 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 no status recorded