Hitachi High-Tech Electronics Engineering Co., Ltd.
Records under this name other than patents Hitachi High-Tech Electronics Engineering Co., Ltd. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
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| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,129,702 | Xy Stage, Head Carriage and Tester of Magnetic Head or Magnetic Disk Formerly held Term ended Term ended Oct 13, 2024 · High confidence | Term ended | Term ended Oct 13, 2024 | High confidence |
| US 6,888,918 | Surface Inspection Method and Surface Inspection Apparatus Formerly held Term ended Term ended Nov 18, 2023 · High confidence | Term ended | Term ended Nov 18, 2023 | High confidence |
| US 6,876,445 | Method for Analyzing Defect Data and Inspection Apparatus and Review System Formerly held Term ended Term ended May 28, 2023 · High confidence | Term ended | Term ended May 28, 2023 | High confidence |
| US 6,888,959 | Method of Inspecting a Semiconductor Device and an Apparatus Thereof Formerly held Term ended Term ended Nov 28, 2022 · High confidence | Term ended | Term ended Nov 28, 2022 | High confidence |
| US 6,798,504 | Apparatus and Method for Inspecting Surface of Semiconductor Wafer or the Like Formerly held Term ended Term ended Jul 5, 2022 · High confidence | Term ended | Term ended Jul 5, 2022 | High confidence |
| US 6,797,975 | Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device Term ended Term ended May 13, 2022 · High confidence | Term ended | Term ended May 13, 2022 | High confidence |
| US 6,936,835 | Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device Formerly held Term ended Term ended Mar 23, 2022 · High confidence | Term ended | Term ended Mar 23, 2022 | High confidence |
| US 6,998,630 | Method and Its Apparatus for Inspecting Particles or Defects of a Semiconductor Device Term ended Term ended Aug 17, 2021 · High confidence | Term ended | Term ended Aug 17, 2021 | High confidence |
| US 6,597,448 | Apparatus and method of inspecting foreign particle or defect on a sample Formerly held Term ended Term ended May 18, 2021 · From the USPTO record | Term ended | Term ended May 18, 2021 | From the USPTO record |
| US 6,365,425 | Method of manufacturing semiconductor device Formerly held Term ended Term ended Jun 27, 2020 · From the USPTO record | Term ended | Term ended Jun 27, 2020 | From the USPTO record |