Intekplus Co., Ltd.
1 more in force is now held by another company
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
5
Ending by 2030
Jan 2029
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
No maintenance fee falls due on this company's record before Nov 14, 2027.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,056,698 | Tray handling apparatus and semiconductor device inspecting method using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 8,155,483 | Apparatus for and method of measuring image In force · From the USPTO record | In force | From the USPTO record | |
| US 8,259,305 | Surface shape measuring system and surface shape measuring method using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 8,493,570 | Three-dimensional shape measuring apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 8,319,961 | Apparatus to Perform a Non-Contact Test of a Semiconductor Package In force · High confidence | In force | High confidence | |
| US 8,314,405 | Apparatus for Measuring Fluorescence Lifetime In force · High confidence | In force | High confidence | |
| US 9,412,159 | Method for inspecting flat panel In force · From the USPTO record | In force | From the USPTO record | |
| US 10,753,872 | Apparatus and method for measuring fluorescence lifetime In force · From the USPTO record | In force | From the USPTO record | |
| US 10,845,311 | Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error through virtual fluorescence distribution model from signal collected in analog mean delay method In force · From the USPTO record | In force | From the USPTO record | |
| US 11,280,736 | Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 13: 1 patent in force now held by others · 1 lapsed for an unpaid fee · 2 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
3 no status recorded