Kromek Limited
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
14
Ending by 2030
Dec 2026
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 2 fees due Jan 21, 2027
- 1 fee due Apr 22, 2027The maintenance fee for Detector and method of operation (US 10,451,746) comes due Apr 22, 2027. Unpaid by Oct 22, 2027, it lapses early.
- 1 fee due May 17, 2027The maintenance fee for Cross calibration of two energy dispersive X-ray baggage screening systems including transformation of the reference database (US 9,188,550) comes due May 17, 2027. Unpaid by Nov 17, 2027, it lapses early.
- 1 fee due Jun 1, 2027The maintenance fee for Semiconductor device connection (US 9,202,838) comes due Jun 1, 2027. Unpaid by Dec 1, 2027, it lapses early.
- 1 fee due Jul 9, 2027The maintenance fee for Scintillation detector (US 11,867,850) comes due Jul 9, 2027. Unpaid by Jan 10, 2028, it lapses early.
- 2 fees due Sep 12 to 22, 2027 · next Sep 12
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,093,671 | Semiconductor device with a bulk single crystal on a substrate In force · From the USPTO record | In force | From the USPTO record | |
| US 8,093,095 | Semiconductor device with a bulk single crystal on a substrate In force · From the USPTO record | In force | From the USPTO record | |
| US 7,634,051 | Imaging of materials In force · From the USPTO record | In force | From the USPTO record | |
| US 7,656,995 | Imaging of materials In force · From the USPTO record | In force | From the USPTO record | |
| US 7,693,261 | Method and apparatus for inspection of materials In force · From the USPTO record | In force | From the USPTO record | |
| US 8,233,588 | Method and apparatus for inspection of materials In force · From the USPTO record | In force | From the USPTO record | |
| US 8,537,968 | Method and apparatus for inspection of materials In force · From the USPTO record | In force | From the USPTO record | |
| US 8,478,016 | Radiographic data interpretation In force · From the USPTO record | In force | From the USPTO record | |
| US 8,968,469 | Semiconductor Device and Method of Manufacture Thereof In force · Medium confidence | In force | Medium confidence | |
| US 8,660,237 | Apparatus and method for viewing an object In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 40: 1 lapsed for an unpaid fee · 1 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
2 pending · 1 abandoned · 11 no status recorded