Lasertec Corporation
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 2 name spellings.
4
Ending by 2030
Feb 2028
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Feb 25, 2027The maintenance fee for Chucking device and chucking method (US 9,117,869) comes due Feb 25, 2027. Unpaid by Aug 25, 2027, it lapses early.
- 1 fee due May 21, 2027The maintenance fee for Image pickup apparatus and focus adjustment method using bending correction to adjust focusing (US 11,822,233) comes due May 21, 2027. Unpaid by Nov 22, 2027, it lapses early.
- 2 fees due Jul 19 to 21, 2027 · next Jul 19
- 1 fee due Nov 5, 2027The maintenance fee for Optical apparatus and vibration removing method (US 10,645,289) comes due Nov 5, 2027. Unpaid by May 5, 2028, it lapses early.
Recent changes
- 1 of the patents on this record was granted since Aug 17, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,548,309 | Inspection apparatus, inspection method, and manufacturing method of pattern substrate In force · From the USPTO record | In force | From the USPTO record | |
| US 7,907,270 | Inspection apparatus and method, and production method for pattern substrates In force · From the USPTO record | In force | From the USPTO record | |
| US 7,764,414 | Illumination apparatus and illumination method In force · From the USPTO record | In force | From the USPTO record | |
| US 8,305,681 | Light source apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 8,503,068 | Radiation source apparatus and DUV beam generation method In force · From the USPTO record | In force | From the USPTO record | |
| US 8,760,642 | Substrate inspection apparatus and mask inspection apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 9,117,869 | Chucking device and chucking method In force · From the USPTO record | In force | From the USPTO record | |
| US 9,240,041 | Defect inspection device, defect inspection method, and defect inspection program In force · From the USPTO record | In force | From the USPTO record | |
| US 8,879,055 | Inspection method and inspection apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 9,638,739 | Defect coordinates measurement device, defect coordinates measurement method, mask manufacturing method, and reference mask In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 42: 12 lapsed for an unpaid fee · 8 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
13 pending · 1 abandoned · 5 no status recorded