Multimetrixs, LLC
Records under this name other than patents Multimetrixs, LLC holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
Showing 1 to 9 of 9 · Back to Multimetrixs, LLC
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,140,655 | Precision soft-touch gripping mechanism for flat objects Lapsed on the fee record Ended Nov 28, 2014 · From the USPTO record | Lapsed on the fee record | Ended Nov 28, 2014 | From the USPTO record |
| US 6,831,287 | Method and apparatus for preventing transfer of an object having wrong dimensions or orientation Lapsed on the fee record Ended Dec 14, 2012 · From the USPTO record | Lapsed on the fee record | Ended Dec 14, 2012 | From the USPTO record |
| US 6,815,958 | Method and apparatus for measuring thickness of thin films with improved accuracy Lapsed on the fee record Ended Nov 9, 2012 · From the USPTO record | Lapsed on the fee record | Ended Nov 9, 2012 | From the USPTO record |
| US 6,801,044 | Universal electromagnetic resonance system for detecting and measuring local non-uniformities in metal and non-metal objects Lapsed on the fee record Ended Oct 5, 2012 · From the USPTO record | Lapsed on the fee record | Ended Oct 5, 2012 | From the USPTO record |
| US 6,989,675 | Method and apparatus for precision measurement of film thickness Lapsed on the fee record Ended Jan 24, 2010 · From the USPTO record | Lapsed on the fee record | Ended Jan 24, 2010 | From the USPTO record |
| US 6,900,451 | Mapping sensor system for detecting positions of flat objects Lapsed on the fee record Ended May 31, 2009 · From the USPTO record | Lapsed on the fee record | Ended May 31, 2009 | From the USPTO record |
| US 6,891,380 | System and method for measuring characteristics of materials with the use of a composite sensor Lapsed on the fee record Ended May 10, 2009 · From the USPTO record | Lapsed on the fee record | Ended May 10, 2009 | From the USPTO record |
| US 6,842,025 | Apparatus and method for multiple identical continuous records of characteristics on the surface of an object after selected stages of manufacture and treatment Lapsed on the fee record Ended Jan 11, 2009 · From the USPTO record | Lapsed on the fee record | Ended Jan 11, 2009 | From the USPTO record |
| US 6,593,738 | Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors Lapsed on the fee record Ended Jul 15, 2007 · From the USPTO record | Lapsed on the fee record | Ended Jul 15, 2007 | From the USPTO record |