NCS Testing Technology Co., Ltd.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Oct 2039
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Mar 12, 2027The maintenance fee for Measurement deviation correction method and system for spark discharge analysis of large-size metal material (US 11,754,503) comes due Mar 12, 2027. Unpaid by Sep 13, 2027, it lapses early.
- 1 fee due Aug 20, 2027The maintenance fee for High-throughput and small size samples tension, compression, bending test system and method thereof (US 11,906,474) comes due Aug 20, 2027. Unpaid by Feb 22, 2028, it lapses early.
- 1 fee due Sep 12, 2027The maintenance fee for Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy (US 11,927,511) comes due Sep 12, 2027. Unpaid by Mar 13, 2028, it lapses early.
- 1 fee due Oct 30, 2027The maintenance fee for Combined oxygen, nitrogen and hydrogen joint determination device and method based on thermal conductivity-infrared technique (US 11,971,349) comes due Oct 30, 2027. Unpaid by May 1, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 10,804,073 | Apparatus and method for large-scale high throughput quantitative characterization and three-dimensional reconstruction of material structure In force · From the USPTO record | In force | From the USPTO record | |
| US 11,193,867 | System and method for high-throughput test of mechanical properties of miniature specimens In force · From the USPTO record | In force | From the USPTO record | |
| US 12,019,025 | Apparatus and method for preparing glow discharge sputtering samples for material microscopic characterization In force · From the USPTO record | In force | From the USPTO record | |
| US 11,506,650 | Method for automatic quantitative statistical distribution characterization of dendrite structures in a full view field of metal materials In force · From the USPTO record | In force | From the USPTO record | |
| US 11,906,474 | High-throughput and small size samples tension, compression, bending test system and method thereof In force · From the USPTO record | In force | From the USPTO record | |
| US 11,754,503 | Measurement deviation correction method and system for spark discharge analysis of large-size metal material In force · From the USPTO record | In force | From the USPTO record | |
| US 11,927,511 | Method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy In force · From the USPTO record | In force | From the USPTO record | |
| US 12,042,865 | High-throughput 3D printing system for preparing multi-component, small sized samples In force · From the USPTO record | In force | From the USPTO record | |
| US 12,203,864 | Spark spectrometry for inclusions content distribution on the surface of large size metallic materials In force · From the USPTO record | In force | From the USPTO record | |
| US 12,146,845 | Component residual stress testing platform based on neutron diffraction and experimental method thereof In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 16: 1 lapsed for an unpaid fee. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 pending · 1 abandoned