Otsuka Electronics Co., Ltd.
1 more in force is now held by another company
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 4 name spellings.
0
Ending by 2030
Oct 2031
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 2 fees due Mar 24, 2027
- 2 fees due Apr 1 to 20, 2027 · next Apr 1
- 2 fees due May 19, 2027
- 1 fee due Aug 6, 2027The maintenance fee for Optical measurement system, optical measurement method, and non-transitory storage medium having measurement program stored thereon (US 11,892,281) comes due Aug 6, 2027. Unpaid by Feb 7, 2028, it lapses early.
- 1 fee due Oct 9, 2027The maintenance fee for Zeta-potential measurement jig (US 11,953,465) comes due Oct 9, 2027. Unpaid by Apr 10, 2028, it lapses early.
Recent changes
- 1 of the patents on this record was granted since Aug 16, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,422,018 | Optical measurement apparatus including hemispherical optical integrator In force · From the USPTO record | In force | From the USPTO record | |
| US 8,999,131 | Electrophoretic mobility measurement cell and measurement apparatus and method using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 8,582,124 | Optical characteristic measuring apparatus and optical characteristic measuring method In force · From the USPTO record | In force | From the USPTO record | |
| US 8,982,341 | Light Distribution Characteristic Measurement Apparatus and Light Distribution Characteristic Measurement Method In force · High confidence | In force | High confidence | |
| US 9,163,985 | Spectral characteristic measurement apparatus and spectral characteristic measurement method In force · From the USPTO record | In force | From the USPTO record | |
| US D869,310 | Sample analyzer In force · From the USPTO record | In force | From the USPTO record | |
| US 10,422,694 | Optical characteristic measurement system and calibration method for optical characteristic measurement system In force · From the USPTO record | In force | From the USPTO record | |
| US 10,422,695 | Optical characteristic measurement system and calibration method for optical characteristic measurement system In force · From the USPTO record | In force | From the USPTO record | |
| US 9,891,105 | Microspectroscope including optical fibers and spectroscope In force · From the USPTO record | In force | From the USPTO record | |
| US 10,222,261 | Optical Characteristic Measurement System and Calibration Method for Optical Characteristic Measurement System In force · High confidence | In force | High confidence |
Also on record, not counted in the 34: 1 patent in force now held by others · 37 lapsed for an unpaid fee · 23 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
4 pending · 2 abandoned · 9 no status recorded