Park Systems Corp.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
6
Ending by 2030
Dec 2026
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Jan 14, 2027The maintenance fee for Leveling apparatus and atomic force microscope including the same (US 9,081,272) comes due Jan 14, 2027. Unpaid by Jul 14, 2027, it lapses early.
- 1 fee due Mar 19, 2027The maintenance fee for Method and apparatus for identifying sample position in atomic force microscope (US 11,761,981) comes due Mar 19, 2027. Unpaid by Sep 20, 2027, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,644,447 | Scanning probe microscope capable of measuring samples having overhang structure In force · From the USPTO record | In force | From the USPTO record | |
| US 7,514,679 | Scanning probe microscope for measuring angle and method of measuring a sample using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 8,209,766 | Scanning probe microscope capable of measuring samples having overhang structure In force · From the USPTO record | In force | From the USPTO record | |
| US 8,099,793 | Scanning probe microscope with automatic probe replacement function In force · From the USPTO record | In force | From the USPTO record | |
| US 7,709,791 | Scanning probe microscope with automatic probe replacement function In force · From the USPTO record | In force | From the USPTO record | |
| US 8,402,560 | Scanning probe microscope with drift compensation In force · From the USPTO record | In force | From the USPTO record | |
| US 9,081,272 | Leveling apparatus and atomic force microscope including the same In force · From the USPTO record | In force | From the USPTO record | |
| US 10,133,052 | Image acquiring method and image acquiring apparatus using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 9,645,169 | Measurement apparatus and method with adaptive scan rate In force · From the USPTO record | In force | From the USPTO record | |
| US 9,645,168 | Head limiting movement range of laser spot and atomic force microscope having the same In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 21: 4 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 pending · 3 no status recorded