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Progress Bank

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Records under this name other than patents Progress Bank holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.

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PatentTitleStatus Expires Confidence
US 6,009,759Minimizing the effect of bending on ultrasonic measurements in a load-bearing member
Lapsed on the fee record
Ended Jan 4, 2004 · From the USPTO record
Lapsed on the fee recordEnded Jan 4, 2004From the USPTO record
US 4,261,000High voltage semiconductor device having an improved dv/dt capability
Term ended
Term ended no later than Apr 7, 2001 · Low confidence
Term endedTerm ended no later than Apr 7, 2001Low confidence
US 4,305,084Semiconductor switching device capable of turn-on only at low applied voltages using self pinch-off means
Term ended
Term ended no later than Dec 8, 2001 · Low confidence
Term endedTerm ended no later than Dec 8, 2001Low confidence
US 4,315,591Method for thermo-compression diffusion bonding a structured copper strain buffer to each side of a substrateless semiconductor device wafer
Term ended
Term ended no later than Feb 16, 2002 · Low confidence
Term endedTerm ended no later than Feb 16, 2002Low confidence
US 4,385,310Structured copper strain buffer
Term ended
Term ended no later than May 24, 2003 · Low confidence
Term endedTerm ended no later than May 24, 2003Low confidence
US 4,392,153Cooled semiconductor power module including structured strain buffers without dry interfaces
Term ended
Term ended no later than Jul 5, 2003 · Low confidence
Term endedTerm ended no later than Jul 5, 2003Low confidence
US 4,569,118Planar gate turn-off field controlled thyristors and planar junction gate field effect transistors, and method of making same
Term ended
Term ended no later than Feb 11, 2006 · Low confidence
Term endedTerm ended no later than Feb 11, 2006Low confidence
US 4,574,299Thyristor packaging system
Term ended
Term ended no later than Mar 4, 2006 · Low confidence
Term endedTerm ended no later than Mar 4, 2006Low confidence
US 4,602,511Method for measuring fastener stress utilizing longitudinal and transverse ultrasonic wave time-of-flight
Term ended
Term ended no later than Jul 29, 2006 · Low confidence
Term endedTerm ended no later than Jul 29, 2006Low confidence
US 4,622,572High voltage semiconductor device having an improved DV/DT capability and plasma spreading
Term ended
Term ended no later than Nov 11, 2006 · Low confidence
Term endedTerm ended no later than Nov 11, 2006Low confidence
10 of 19 patents shown.
Pro members see all 19.
Pro members: see all 19 patents
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