Semiconductor Diagnostics, Inc.
Records under this name other than patents Semiconductor Diagnostics, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
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| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,093,920 | Accurate measuring of long steady state minority carrier diffusion lengths Formerly held In force · From the USPTO record | In force | From the USPTO record | |
| US 7,202,691 | Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers Formerly held Term ended Term ended Jul 27, 2025 · From the USPTO record | Term ended | Term ended Jul 27, 2025 | From the USPTO record |
| US 6,680,621 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Term ended Ended no later than May 8, 2021 · From the USPTO record | Term ended | Ended no later than May 8, 2021 | From the USPTO record |
| US 6,597,193 | Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current Formerly held Term ended Term ended Mar 16, 2021 · From the USPTO record | Term ended | Term ended Mar 16, 2021 | From the USPTO record |
| US 6,512,384 | Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages Formerly held Term ended Term ended Sep 28, 2020 · From the USPTO record | Term ended | Term ended Sep 28, 2020 | From the USPTO record |
| US 6,037,797 | Measurement of the interface trap charge in an oxide semiconductor layer interface Term ended Term ended Jul 11, 2017 · From the USPTO record | Term ended | Term ended Jul 11, 2017 | From the USPTO record |
| US 6,815,974 | Determining composition of mixed dielectrics Lapsed on the fee record Ended Nov 9, 2012 · From the USPTO record | Lapsed on the fee record | Ended Nov 9, 2012 | From the USPTO record |
| US 7,405,580 | Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration Lapsed on the fee record Ended Jul 29, 2012 · From the USPTO record | Lapsed on the fee record | Ended Jul 29, 2012 | From the USPTO record |
| US 6,569,691 | Measurement of different mobile ion concentrations in the oxide layer of a semiconductor wafer Lapsed on the fee record Ended May 27, 2011 · From the USPTO record | Lapsed on the fee record | Ended May 27, 2011 | From the USPTO record |
| US 6,538,462 | Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge Lapsed on the fee record Ended Mar 25, 2011 · From the USPTO record | Lapsed on the fee record | Ended Mar 25, 2011 | From the USPTO record |