Solid State Measurements, Inc.
Records under this name other than patents Solid State Measurements, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
Back to Solid State Measurements, Inc.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 6,972,582 | Apparatus and method for measuring semiconductor wafer electrical properties Lapsed on the fee record Ended Dec 6, 2017 · From the USPTO record | Lapsed on the fee record | Ended Dec 6, 2017 | From the USPTO record |
| US 6,943,562 | Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits Lapsed on the fee record Ended Sep 13, 2017 · From the USPTO record | Lapsed on the fee record | Ended Sep 13, 2017 | From the USPTO record |
| US 6,052,653 | Spreading resistance profiling system Formerly held Term ended Term ended Jul 11, 2017 · From the USPTO record | Term ended | Term ended Jul 11, 2017 | From the USPTO record |
| US 6,900,652 | Flexible membrane probe and method of use thereof Lapsed on the fee record Ended May 31, 2017 · From the USPTO record | Lapsed on the fee record | Ended May 31, 2017 | From the USPTO record |
| US 6,894,519 | Apparatus and method for determining electrical properties of a semiconductor wafer Lapsed on the fee record Ended May 17, 2017 · From the USPTO record | Lapsed on the fee record | Ended May 17, 2017 | From the USPTO record |
| US 6,879,176 | Conductance-voltage (GV) based method for determining leakage current in dielectrics Lapsed on the fee record Ended Apr 12, 2017 · From the USPTO record | Lapsed on the fee record | Ended Apr 12, 2017 | From the USPTO record |
| US 6,856,140 | System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes Formerly held Lapsed on the fee record Ended Feb 15, 2017 · From the USPTO record | Lapsed on the fee record | Ended Feb 15, 2017 | From the USPTO record |
| US 6,851,096 | Method and apparatus for testing semiconductor wafers Lapsed on the fee record Ended Feb 1, 2017 · From the USPTO record | Lapsed on the fee record | Ended Feb 1, 2017 | From the USPTO record |
| US 6,842,029 | Non-invasive electrical measurement of semiconductor wafers Formerly held Lapsed on the fee record Ended Jan 11, 2017 · From the USPTO record | Lapsed on the fee record | Ended Jan 11, 2017 | From the USPTO record |
| US 6,836,139 | Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer Lapsed on the fee record Ended Dec 28, 2016 · From the USPTO record | Lapsed on the fee record | Ended Dec 28, 2016 | From the USPTO record |