Star Technologies, Inc.
18 more in force are now held by other companies
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 2 name spellings.
3
Ending by 2030
May 2028
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due May 28, 2027The maintenance fee for Test apparatus and jumper thereof (US 11,828,789) comes due May 28, 2027. Unpaid by Nov 29, 2027, it lapses early.
- 1 fee due Oct 9, 2027The maintenance fee for Switching matrix system and operating method thereof for semiconductor characteristic measurement (US 11,953,518) comes due Oct 9, 2027. Unpaid by Apr 10, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,675,307 | Heating apparatus for semiconductor devices In force · From the USPTO record | In force | From the USPTO record | |
| US 8,198,725 | Heat sink and integrated circuit assembly using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 8,310,264 | Method for configuring combinational switching matrix and testing system for semiconductor devices using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 9,885,746 | Switching matrix and testing system for semiconductor characteristic measurement using the same In force · From the USPTO record | In force | From the USPTO record | |
| US 9,739,830 | Test assembly In force · From the USPTO record | In force | From the USPTO record | |
| US 10,184,957 | Testing apparatus, holding assembly, and probe card carrier In force · From the USPTO record | In force | From the USPTO record | |
| US 10,890,614 | Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test In force · From the USPTO record | In force | From the USPTO record | |
| US 11,054,465 | Method of operating a probing apparatus In force · From the USPTO record | In force | From the USPTO record | |
| US 11,217,649 | Method of testing and analyzing display panel In force · From the USPTO record | In force | From the USPTO record | |
| US 11,209,462 | Testing apparatus In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 16: 18 patents in force now held by others · 2 lapsed for an unpaid fee · 16 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
3 pending · 1 abandoned · 17 no status recorded