Tasmit, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Jun 2038
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Apr 15, 2027The maintenance fee for Method of verifying operation parameter of scanning electron microscope (US 10,446,365) comes due Apr 15, 2027. Unpaid by Oct 15, 2027, it lapses early.
- 1 fee due Jun 24, 2027The maintenance fee for Secondary particle detection system of scanning electron microscope (US 10,515,778) comes due Jun 24, 2027. Unpaid by Dec 27, 2027, it lapses early.
- 1 fee due Oct 7, 2027The maintenance fee for Image generation method (US 10,614,999) comes due Oct 7, 2027. Unpaid by Apr 7, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 10,446,365 | Method of verifying operation parameter of scanning electron microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 10,614,999 | Image generation method In force · From the USPTO record | In force | From the USPTO record | |
| US 10,515,778 | Secondary particle detection system of scanning electron microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 10,802,073 | Pattern defect detection method In force · From the USPTO record | In force | From the USPTO record | |
| US 11,380,513 | Autofocus method for a scanning electron microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 11,322,332 | Apparatus and method for measuring energy spectrum of backscattered electrons In force · From the USPTO record | In force | From the USPTO record | |
| US 11,468,555 | Method and apparatus for generating a correction line indicating relationship between deviation of an edge of a wafer pattern from an edge of a reference pattern and space width of the reference pattern, and a computer-readable recording medium In force · From the USPTO record | In force | From the USPTO record | |
| US 11,436,736 | Pattern Edge Detection Method In force · High confidence | In force | High confidence | |
| US 12,243,237 | Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detection In force · From the USPTO record | In force | From the USPTO record | |
| US 12,555,220 | Pattern Defect Detection Method In force · High confidence | In force | High confidence |
Also on record, not counted in the 12: 10 lapsed for an unpaid fee · 2 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 pending · 3 no status recorded