Technoprobe S.P.A.

44 patents currently held · Updated Nov 14, 2026

Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.

Recorded under 2 name spellings.

Ending by 2030

Feb 2032

Next term end

When these terms end

5 yrs10 yrs20 yrs

Held patents by the year their term ends

20262027202820292030203120322033203420352036203720382039204020412042204320442045

Fee deadlines

Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.

1 fee due Dec 30, 2026
The maintenance fee for Interface board of a testing head for a test equipment of electronic devices and corresponding probe head (US 9,069,015) comes due Dec 30, 2026. Unpaid by Jun 30, 2027, it lapses early.
1 fee due Jan 30, 2027
The maintenance fee for Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product (US 10,365,299) comes due Jan 30, 2027. Unpaid by Jul 30, 2027, it lapses early.
1 fee due Feb 20, 2027
The maintenance fee for Contact probe and corresponding testing head (US 10,386,388) comes due Feb 20, 2027. Unpaid by Aug 20, 2027, it lapses early.
1 fee due Mar 3, 2027
The maintenance fee for Manufacturing method of contact probes for a testing head (US 10,401,387) comes due Mar 3, 2027. Unpaid by Sep 3, 2027, it lapses early.
1 fee due Apr 10, 2027
The maintenance fee for Probe card for a testing apparatus of electronic devices (US 11,782,075) comes due Apr 10, 2027. Unpaid by Oct 12, 2027, it lapses early.
2 fees due May 7 to 28, 2027 · next May 7
1 fee due Jun 17, 2027
The maintenance fee for Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications (US 10,509,056) comes due Jun 17, 2027. Unpaid by Dec 17, 2027, it lapses early.
1 fee due Jul 9, 2027
The maintenance fee for Vertical probe head having an improved contact with a device under test (US 11,867,723) comes due Jul 9, 2027. Unpaid by Jan 10, 2028, it lapses early.
1 fee due Aug 4, 2027
The maintenance fee for Testing head comprising vertical probes (US 10,551,433) comes due Aug 4, 2027. Unpaid by Feb 4, 2028, it lapses early.
2 fees due Sep 3 to 5, 2027 · next Sep 3
2 fees due Oct 9 to 30, 2027 · next Oct 9

Which patents, and when each one lapses · Pro

Recent changes

1 term has ended since Aug 16, 2026

Patents held now

Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.

Patent	Title	Status	Expires	Confidence
US 8,981,803	Method for Cleaning a Contact Pad of a Microstructure and Corresponding Cantilever Contact Probe and Probe Testing Head In force Term ends Feb 5, 2032 · High confidence	In force	Term ends Feb 5, 2032	High confidence
US 9,069,015	Interface board of a testing head for a test equipment of electronic devices and corresponding probe head In force Term ends Jan 19, 2033 · From the USPTO record	In force	Term ends Jan 19, 2033	From the USPTO record
US 9,429,593	Testing head for a test equipment of electronic devices In force Term ends Feb 17, 2034 · From the USPTO record	In force	Term ends Feb 17, 2034	From the USPTO record
US 9,829,508	Testing head of electronic devices In force Term ends Oct 17, 2034 · From the USPTO record	In force	Term ends Oct 17, 2034	From the USPTO record
US 10,151,775	High-Planarity Probe Card for a Testing Apparatus for Electronic Devices In force Term ends Mar 5, 2035 · High confidence	In force	Term ends Mar 5, 2035	High confidence
US 10,509,056	Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications In force Term ends Mar 5, 2035 · From the USPTO record	In force	Term ends Mar 5, 2035	From the USPTO record
US 9,423,421	Testing head for a test equipment of electronic devices In force Term ends May 30, 2035 · From the USPTO record	In force	Term ends May 30, 2035	From the USPTO record
US 11,131,690	Contact probe for testing head In force Term ends Dec 14, 2035 · From the USPTO record	In force	Term ends Dec 14, 2035	From the USPTO record
US 10,365,299	Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished product In force Term ends Dec 29, 2035 · From the USPTO record	In force	Term ends Dec 29, 2035	From the USPTO record
US 10,401,387	Manufacturing method of contact probes for a testing head In force Term ends Feb 7, 2036 · From the USPTO record	In force	Term ends Feb 7, 2036	From the USPTO record

10 of 44 patents shown.

Pro members see all 44.

Pro members: see all 44 patents

Also on record, not counted in the 44: 11 lapsed for an unpaid fee · 3 ended at full term. List them

Sources and methods

Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand. How this record was built

Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.

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Published applications

US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.

2 pending · 2 abandoned · 13 no status recorded

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