Test Research, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
5
Ending by 2030
May 2027
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Mar 22, 2027The maintenance fee for Testing apparatus with backdriving protection function (US 9,140,755) comes due Mar 22, 2027. Unpaid by Sep 22, 2027, it lapses early.
- 1 fee due Apr 8, 2027The maintenance fee for Automatic optical inspection system and operating method thereof (US 10,438,340) comes due Apr 8, 2027. Unpaid by Oct 8, 2027, it lapses early.
- 1 fee due Sep 24, 2027The maintenance fee for Optical inspection apparatus (US 10,600,174) comes due Sep 24, 2027. Unpaid by Mar 24, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,529,336 | System and method for laminography inspection In force · From the USPTO record | In force | From the USPTO record | |
| US 7,612,568 | Open-circuit testing system and method In force · From the USPTO record | In force | From the USPTO record | |
| US 7,702,982 | Electronic device testing system and method In force · From the USPTO record | In force | From the USPTO record | |
| US 7,855,567 | Electronic device testing system and method In force · From the USPTO record | In force | From the USPTO record | |
| US 8,077,827 | Method for thickness calibration and measuring thickness of material In force · From the USPTO record | In force | From the USPTO record | |
| US 8,179,143 | Apparatus for testing printed circuit and method therefor In force · From the USPTO record | In force | From the USPTO record | |
| US 8,324,908 | Electrical connection defect detection device In force · From the USPTO record | In force | From the USPTO record | |
| US 8,350,575 | Electrical connection defect detection system and method In force · From the USPTO record | In force | From the USPTO record | |
| US 8,843,357 | Electrical connection defect simulation test method and system of the same In force · From the USPTO record | In force | From the USPTO record | |
| US 9,015,541 | Device and method for performing timing analysis In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 30: 1 lapsed for an unpaid fee. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
1 pending · 5 no status recorded