Transtech Systems, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Nov 2034
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 4 fees due Dec 18 to 25, 2026 · next Dec 18
- 1 fee due Jul 7, 2027The maintenance fee for Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomography (US 10,527,570) comes due Jul 7, 2027. Unpaid by Jan 7, 2028, it lapses early.
- 1 fee due Oct 23, 2027The maintenance fee for Parallel plate capacitor system for determining impedance characteristics of material under test (MUT) (US 11,965,873) comes due Oct 23, 2027. Unpaid by Apr 24, 2028, it lapses early.
- 1 fee due Nov 7, 2027The maintenance fee for Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test (US 11,977,040) comes due Nov 7, 2027. Unpaid by May 8, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 10,324,052 | Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy In force · From the USPTO record | In force | From the USPTO record | |
| US 9,465,061 | In-process material characterization In force · From the USPTO record | In force | From the USPTO record | |
| US 9,863,900 | Planar sensor array for non-destructive evaluation of material using electromagnetic impedance In force · From the USPTO record | In force | From the USPTO record | |
| US 10,739,287 | Measurement and monitoring of physical properties of material under test (MUT) from a vehicle In force · From the USPTO record | In force | From the USPTO record | |
| US 10,161,893 | Characterization of material under test (MUT) with electromagnetic impedance spectroscopy In force · From the USPTO record | In force | From the USPTO record | |
| US 10,527,570 | Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomography In force · From the USPTO record | In force | From the USPTO record | |
| US 10,330,616 | System and circuit for obtaining impedance or dielectric measurements of a material under test In force · From the USPTO record | In force | From the USPTO record | |
| US 11,268,922 | Electromagnetic Impedance Spectroscopy Apparatus and Related Planar Sensor System In force · High confidence | In force | High confidence | |
| US 11,680,920 | Electromagnetic Impedance Spectroscopy Apparatus and Related Planar Sensor System In force · High confidence | In force | High confidence | |
| US 12,560,565 | Electromagnetic Impedance Spectroscopy Apparatus and Related Planar Sensor System In force · High confidence | In force | High confidence |
Also on record, not counted in the 17: 4 lapsed for an unpaid fee · 9 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
7 no status recorded