Tse Co., Ltd.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Jul 2038
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Mar 19, 2027The maintenance fee for Electroconductive particles and signal-transmitting connector having same (US 11,763,959) comes due Mar 19, 2027. Unpaid by Sep 20, 2027, it lapses early.
- 1 fee due Sep 26, 2027The maintenance fee for Test apparatus for semiconductor package (US 11,940,484) comes due Sep 26, 2027. Unpaid by Mar 27, 2028, it lapses early.
Recent changes
- 1 of the patents on this record was granted since Aug 17, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 10,718,809 | History management pad of semiconductor test socket, manufacturing method thereof, and semiconductor test device including history management pad In force · From the USPTO record | In force | From the USPTO record | |
| US 11,233,352 | Electro-conductive part protecting member for signal transmission connector In force · From the USPTO record | In force | From the USPTO record | |
| US 12,000,863 | Probe pin having gripping structure In force · From the USPTO record | In force | From the USPTO record | |
| US 11,763,959 | Electroconductive particles and signal-transmitting connector having same In force · From the USPTO record | In force | From the USPTO record | |
| US 11,199,577 | Test socket and test apparatus having the same, manufacturing method for the test socket In force · From the USPTO record | In force | From the USPTO record | |
| US 11,131,707 | Test socket and test apparatus having the same, manufacturing method for the test socket In force · From the USPTO record | In force | From the USPTO record | |
| US 11,573,248 | Test socket and test apparatus having the same In force · From the USPTO record | In force | From the USPTO record | |
| US 11,506,705 | Test socket and test apparatus having the same In force · From the USPTO record | In force | From the USPTO record | |
| US 11,609,244 | Test Apparatus for Semiconductor Package In force · High confidence | In force | High confidence | |
| US 12,169,211 | Vertical probe pin and a probe card having same In force · From the USPTO record | In force | From the USPTO record |
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
7 pending · 1 no status recorded