Unitest Inc.
2 more in force are now held by other companies
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 2 name spellings.
5
Ending by 2030
Oct 2027
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 3 fees due Apr 6 to 27, 2027 · next Apr 6
- 1 fee due May 24, 2027The maintenance fee for Apparatus and method for correcting output signal of FPGA-based memory test device (US 9,197,212) comes due May 24, 2027. Unpaid by Nov 24, 2027, it lapses early.
- 1 fee due Jul 26, 2027The maintenance fee for Storage interface apparatus for solid state drive tester (US 9,245,613) comes due Jul 26, 2027. Unpaid by Jan 26, 2028, it lapses early.
- 1 fee due Oct 12, 2027The maintenance fee for Apparatus and method for acquiring data of fast fail memory (US 9,312,030) comes due Oct 12, 2027. Unpaid by Apr 12, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,652,497 | Sequential semiconductor device tester In force · From the USPTO record | In force | From the USPTO record | |
| US 7,688,099 | Sequential semiconductor device tester In force · From the USPTO record | In force | From the USPTO record | |
| US 7,656,178 | Method for calibrating semiconductor device tester In force · From the USPTO record | In force | From the USPTO record | |
| US 7,739,572 | Tester for testing semiconductor device In force · From the USPTO record | In force | From the USPTO record | |
| US 7,872,488 | Tester for testing semiconductor device In force · From the USPTO record | In force | From the USPTO record | |
| US 9,459,302 | Device under test tester using redriver In force · From the USPTO record | In force | From the USPTO record | |
| US 9,159,454 | Failure detection apparatus for solid state drive tester In force · From the USPTO record | In force | From the USPTO record | |
| US 9,015,545 | Solid State Drive Tester In force · High confidence | In force | High confidence | |
| US 9,153,345 | Error generating apparatus for solid state drive tester In force · From the USPTO record | In force | From the USPTO record | |
| US 9,171,643 | Solid state drive tester In force · From the USPTO record | In force | From the USPTO record |
Also on record, not counted in the 21: 2 patents in force now held by others · 10 lapsed for an unpaid fee · 5 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
3 pending · 1 abandoned · 3 no status recorded