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Verity Instruments, Inc.

Also on record
Records under this name other than the patents Verity Instruments, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned. None of them is counted in the 20 patents it holds.

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PatentTitleStatus Expires Confidence
US 9,997,325Electron beam exciter for use in chemical analysis in processing systems
Formerly held
In force
 · High confidence
In forceHigh confidence
US 7,589,843Self referencing heterodyne reflectometer and method for implementing
Term ended
Term ended Jan 10, 2026 · From the USPTO record
Term endedTerm ended Jan 10, 2026From the USPTO record
US 7,545,503Self referencing heterodyne reflectometer and method for implementing
Term ended
Term ended Sep 27, 2025 · From the USPTO record
Term endedTerm ended Sep 27, 2025From the USPTO record
US 7,339,682Heterodyne reflectometer for film thickness monitoring and method for implementing
Term ended
Term ended Jul 28, 2025 · From the USPTO record
Term endedTerm ended Jul 28, 2025From the USPTO record
US 7,049,156System and method for in-situ monitor and control of film thickness and trench depth
Term ended
Term ended Jun 15, 2024 · From the USPTO record
Term endedTerm ended Jun 15, 2024From the USPTO record
US 6,991,514Optical closed-loop control system for a CMP apparatus and method of manufacture thereof
Term ended
Term ended Mar 20, 2024 · From the USPTO record
Term endedTerm ended Mar 20, 2024From the USPTO record
US 6,975,393Method and apparatus for implementing an afterglow emission spectroscopy monitor
Term ended
Term ended Jul 30, 2023 · From the USPTO record
Term endedTerm ended Jul 30, 2023From the USPTO record
US 9,386,241Apparatus and method for enhancing dynamic range of charge coupled device-based spectrograph
Term ended
Term ended Jul 2, 2023 · From the USPTO record
Term endedTerm ended Jul 2, 2023From the USPTO record
US 6,830,939System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra
Term ended
Term ended Mar 2, 2023 · From the USPTO record
Term endedTerm ended Mar 2, 2023From the USPTO record
US 6,768,543Wafer inspection apparatus with unique illumination methodology and method of operation
Term ended
Term ended Oct 30, 2022 · From the USPTO record
Term endedTerm ended Oct 30, 2022From the USPTO record
10 of 17 patents shown.
Pro members see all 17.
Pro members: see all 17 patents
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