Xallent Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
0
Ending by 2030
Feb 2036
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 1 fee due Apr 8, 2027The maintenance fee for Systems and methods for manufacturing nano-electro-mechanical-system probes (US 10,436,814) comes due Apr 8, 2027. Unpaid by Oct 8, 2027, it lapses early.
- 1 fee due Jul 28, 2027The maintenance fee for Systems and methods for manufacturing nano-electro-mechanical-system probes (US 10,545,171) comes due Jul 28, 2027. Unpaid by Jan 28, 2028, it lapses early.
- 1 fee due Oct 7, 2027The maintenance fee for Multiple integrated tips scanning probe microscope (US 10,613,115) comes due Oct 7, 2027. Unpaid by Apr 7, 2028, it lapses early.
Recent changes
Nothing was recorded against this company's patents in the last 90 days.
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 10,545,171 | Systems and methods for manufacturing nano-electro-mechanical-system probes In force · From the USPTO record | In force | From the USPTO record | |
| US 10,613,115 | Multiple integrated tips scanning probe microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 10,895,585 | Multiple integrated tips scanning probe microscope In force · From the USPTO record | In force | From the USPTO record | |
| US 11,125,774 | Systems and methods for manufacturing nano-electro-mechanical-system probes In force · From the USPTO record | In force | From the USPTO record | |
| US 11,573,247 | Systems and methods for manufacturing nano-electro-mechanical-system probes In force · From the USPTO record | In force | From the USPTO record | |
| US 10,436,814 | Systems and methods for manufacturing nano-electro-mechanical-system probes In force · From the USPTO record | In force | From the USPTO record | |
| US 11,280,825 | Functional prober chip In force · From the USPTO record | In force | From the USPTO record | |
| US 10,866,273 | Functional prober chip In force · From the USPTO record | In force | From the USPTO record | |
| US 10,663,484 | Multiple integrated tips scanning probe microscope with pre-alignment components In force · From the USPTO record | In force | From the USPTO record | |
| US 12,085,589 | Fine pitch probe card In force · From the USPTO record | In force | From the USPTO record |
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
2 pending · 2 no status recorded