Yieldboost Tech, Inc.
Records under this name other than patents Yieldboost Tech, Inc. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 7,154,292 | Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same Lapsed on the fee record Ended Dec 26, 2018 · From the USPTO record | Lapsed on the fee record | Ended Dec 26, 2018 | From the USPTO record |
| US 7,053,645 | System and method for detecting defects in a thin-film-transistor array Lapsed on the fee record Ended May 30, 2018 · From the USPTO record | Lapsed on the fee record | Ended May 30, 2018 | From the USPTO record |
| US 6,850,086 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process Lapsed on the fee record Ended Feb 1, 2013 · From the USPTO record | Lapsed on the fee record | Ended Feb 1, 2013 | From the USPTO record |
| US 7,064,572 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process Lapsed on the fee record Ended Jun 20, 2010 · From the USPTO record | Lapsed on the fee record | Ended Jun 20, 2010 | From the USPTO record |
| US 7,042,244 | Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same Lapsed on the fee record Ended May 9, 2010 · From the USPTO record | Lapsed on the fee record | Ended May 9, 2010 | From the USPTO record |
| US 7,024,338 | System and method for improving TFT-array manufacturing yields Lapsed on the fee record Ended Apr 4, 2010 · From the USPTO record | Lapsed on the fee record | Ended Apr 4, 2010 | From the USPTO record |
| US 6,996,446 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process Lapsed on the fee record Ended Feb 7, 2010 · From the USPTO record | Lapsed on the fee record | Ended Feb 7, 2010 | From the USPTO record |
| US 6,982,556 | System and method for classifying defects in and identifying process problems for an electrical circuit Lapsed on the fee record Ended Jan 3, 2010 · From the USPTO record | Lapsed on the fee record | Ended Jan 3, 2010 | From the USPTO record |
| US 6,960,927 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process Lapsed on the fee record Ended Nov 1, 2009 · From the USPTO record | Lapsed on the fee record | Ended Nov 1, 2009 | From the USPTO record |
| US 6,949,944 | System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process Lapsed on the fee record Ended Sep 27, 2009 · From the USPTO record | Lapsed on the fee record | Ended Sep 27, 2009 | From the USPTO record |