Lithography System, Sensor and Measuring Method
US 7,868,300 Surrendered on reissueSurrendered on reissue Oct 28, 2014 · High confidence
20-year base term ended Sep 14, 2026
Surrendered on reissue Oct 28, 2014 · its term and maintenance fees continue in US RE45,206 and US RE48,046 and US RE49,602.
Sep 14, 2006
Oct 28, 2014
Jan 11, 2011
Sep 13, 2027
How we calculated this date
| Step | Input | Date after this step | Confidence |
|---|---|---|---|
| Base term, 20 years from filing | Clock starts Sep 14, 2006, when this application, 11/521,705, was filed | Sep 14, 2026 | High confidence |
| Continuity chain | Every parent in the chain resolved | no change | High confidence |
| Patent term adjustment | +364 days, USPTO patent term adjustment record | Sep 13, 2027 | High confidence |
| Terminal disclaimer cap | None on record | no cap applied | High confidence |
| Patent term extension | None on file | no change | High confidence |
| Fee events | 3 of 3 maintenance fees paid | no change | High confidence |
| Reissue | US RE45,206 and US RE48,046 and US RE49,602 issued Oct 28, 2014, and this patent's term continues in it (35 U.S.C. 251, 252) | surrendered Oct 28, 2014 | High confidence |
| Surrendered on reissue | The steps above, in order | Oct 28, 2014 | High confidence |
Sources
Google Patents · The patent document at USPTO · Assignment records at USPTO
USPTO account required: This application in Patent Center · USPTO's maintenance fee lookup
Maintenance fee events come from USPTO's own fee records. Its fee lookup asks for the patent number and the application number.
Not on this page: the patent's family, its recorded assignments and its citation count. USPTO's assignment records, linked above, list every recorded assignment.
Every date shows its work: the base term, any term adjustment or extension, any disclaimer cap, and the maintenance fee record, each with a confidence tier. How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.