Nova Measuring Instruments Ltd.

47 patents currently held · Updated Nov 14, 2026

74 more in force are now held by other companies

Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.

Recorded under 4 name spellings.

Recorded as renamed to Nova Ltd. (2021)

Ending by 2030

Mar 2029

Next term end

When these terms end

5 yrs10 yrs20 yrs

Held patents by the year their term ends

20262027202820292030203120322033203420352036203720382039204020412042204320442045

Fee deadlines

Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.

2 fees due Dec 6 to 20, 2026 · next Dec 6
1 fee due Jan 4, 2027
The maintenance fee for X-Ray Based Measurements in Patterned Structure (US 11,692,953) comes due Jan 4, 2027. Unpaid by Jul 6, 2027, it lapses early.
1 fee due Feb 22, 2027
The maintenance fee for Feed-Forward of Multi-Layer and Multi-Process Information Using XPS and XRF Technologies (US 11,733,035) comes due Feb 22, 2027. Unpaid by Aug 23, 2027, it lapses early.
2 fees due Mar 3 to 19, 2027 · next Mar 3
2 fees due May 19 to 21, 2027 · next May 19
1 fee due Jun 26, 2027
The maintenance fee for Method and System for Monitoring Deposition Process (US 11,852,467) comes due Jun 26, 2027. Unpaid by Dec 27, 2027, it lapses early.
4 fees due Jul 14 to 19, 2027 · next Jul 14
1 fee due Aug 18, 2027
The maintenance fee for Raman Spectroscopy Based Measurements in Patterned Structures (US 10,564,106) comes due Aug 18, 2027. Unpaid by Feb 18, 2028, it lapses early.
1 fee due Sep 29, 2027
The maintenance fee for Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy (US 9,297,771) comes due Sep 29, 2027. Unpaid by Mar 29, 2028, it lapses early.
1 fee due Oct 28, 2027
The maintenance fee for Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry (US 10,636,644) comes due Oct 28, 2027. Unpaid by Apr 28, 2028, it lapses early.
1 fee due Nov 12, 2027
The maintenance fee for Feed-Forward of Multi-Layer and Multi-Process Information Using XPS and XRF Technologies (US 10,648,802) comes due Nov 12, 2027. Unpaid by May 12, 2028, it lapses early.

Which patents, and when each one lapses · Pro

Recent changes

2 of the patents on this record were granted since Aug 16, 2026
2 terms have ended since Aug 16, 2026

Patents held now

Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.

Patent	Title	Status	Expires	Confidence
US 7,720,631	Semiconductor Substrate Processing Method and Apparatus In force Term ends Mar 20, 2029 · High confidence	In force	Term ends Mar 20, 2029	High confidence
US 8,011,830	Method and system for calibrating an X-ray photoelectron spectroscopy measurement In force Term ends Nov 19, 2029 · From the USPTO record	In force	Term ends Nov 19, 2029	From the USPTO record
US 12,152,869	Monitoring system and method for verifying measurements in patterned structures In force Term ends Aug 16, 2032 · From the USPTO record	In force	Term ends Aug 16, 2032	From the USPTO record
US 10,119,925	Methods and Systems for Measuring Periodic Structures Using Multi-Angle X-Ray Reflectance Scatterometry (XRS) In force Term ends Jan 23, 2034 · High confidence	In force	Term ends Jan 23, 2034	High confidence
US 10,481,112	Methods and Systems for Measuring Periodic Structures Using Multi-Angle X-Ray Reflectance Scatterometry (XRS) In force Term ends Jan 23, 2034 · Medium confidence	In force	Term ends Jan 23, 2034	Medium confidence
US 10,859,519	Methods and Systems for Measuring Periodic Structures Using Multi-Angle X-Ray Reflectance Scatterometry (XRS) In force Term ends Jan 23, 2034 · Medium confidence	In force	Term ends Jan 23, 2034	Medium confidence
US 11,874,237	System and Method for Measuring a Sample by X-Ray Reflectance Scatterometry In force Term ends Jan 23, 2034 · Medium confidence	In force	Term ends Jan 23, 2034	Medium confidence
US 12,360,063	System and Method for Measuring a Sample by X-Ray Reflectance Scatterometry In force Term ends Jan 23, 2034 · Low confidence	In force	Term ends Jan 23, 2034	Low confidence
US 10,663,408	Optical phase measurement system and method In force Ends no later than Feb 20, 2034 · From the USPTO record	In force	Ends no later than Feb 20, 2034	From the USPTO record
US 9,297,771	Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy In force Term ends Jun 17, 2034 · From the USPTO record	In force	Term ends Jun 17, 2034	From the USPTO record

10 of 47 patents shown.

Pro members see all 47.

Pro members: see all 47 patents

Also on record, not counted in the 47: 74 patents in force now held by others · 8 lapsed for an unpaid fee · 140 ended at full term. List them

Sources and methods

Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand. How this record was built

Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.

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Published applications

US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.

3 pending · 21 abandoned · 7 no status recorded

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