Nova Measuring Instruments Ltd.
Records under this name other than the patents Nova Measuring Instruments Ltd. holds now: patents now held by others, patents whose terms have ended, and its applications, pending or abandoned. None of them is counted in the 47 patents it holds.
Back to Nova Measuring Instruments Ltd.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,049,882 | Spectrometric Optical Method and System Providing Required Signal-To-Noise of Measurements Formerly held In force · High confidence | In force | High confidence | |
| US 8,643,842 | Method and system for use in monitoring properties of patterned structures Formerly held In force · From the USPTO record | In force | From the USPTO record | |
| US 8,964,178 | Method and System for Use in Monitoring Properties of Patterned Structures Formerly held In force · Medium confidence | In force | Medium confidence | |
| US 9,140,539 | Optical System and Method for Measurement of One or More Parameters of Via-Holes Formerly held In force · High confidence | In force | High confidence | |
| US 8,531,679 | Optical System and Method for Measurement of One or More Parameters of Via-Holes Formerly held In force · High confidence | In force | High confidence | |
| US 8,488,128 | Line edge roughness measuring technique and test structure Formerly held In force · From the USPTO record | In force | From the USPTO record | |
| US 8,142,965 | Method and System for Measuring in Patterned Structures Formerly held In force · High confidence | In force | High confidence | |
| US 8,289,515 | Method and system for use in monitoring properties of patterned structures Formerly held In force · From the USPTO record | In force | From the USPTO record | |
| US 9,904,993 | Method and System for Optimizing Optical Inspection of Patterned Structures Formerly held In force · High confidence | In force | High confidence | |
| US 10,048,595 | Process control using non-zero order diffraction Formerly held In force · From the USPTO record | In force | From the USPTO record |